No sign of the presence of a transitional layer is further reveal

No sign of the presence of a transitional layer is further revealed in Figure  3, which excludes the formation of ternary compounds, for instance, in agreement with the XRD patterns of Figure  2a. BAY 11-7082 supplier The absence of epitaxial

relationship is likely due to (i) the very high lattice mismatch between ZnO and CdTe and to (ii) the high growth rate for the deposition of CdTe by CSS that typically lies in the range of 0.5 to 1 μm/h. This is also usual for the deposition of CdTe by CSS in the form of thin films. In contrast, some epitaxial relationships have been reported for ZnO/ZnSe core-shell NW arrays, despite the polycrystalline nature of the ZnSe shell [13]; however, the growth rate for the deposition of the ZnSe shell by pulsed laser deposition is instead much lower and of the order of 0.03 μm/h, favoring the establishment of epitaxial learn more relationships. The growth of CdTe NGs by CSS basically follows the Volmer-Weber mechanisms [30]: 3D islands initially nucleate on the vertical sidewalls and top of the ZnO NWs, then coarsen, and eventually coalesce to form a continuous 2D shell.

Interestingly, the CdTe NGs are preferentially oriented along the <531 > direction: the degree of preferred orientation as deduced from the Harris method is 0.6, corresponding to a <531 > texture coefficient of 2.4, as shown in Figure  2b. The texture magnitude is hence not pronounced, as expected for polycrystalline thin films deposited by CSS in contrast to standard physical

vapor deposition or sputtering [51]. The texture of CdTe NGs can be accounted for by thermodynamic considerations N-acetylglucosamine-1-phosphate transferase (as usually achieved for polycrystalline thin films), for which grain growth is driven by the minimization of total free energy. The total free energy is dependent upon surface, interface, and Selleck PF-3084014 strain energy, which are strongly anisotropic in CdTe (i.e., the anisotropy factor is equal to 2.32) [52]. Here, CdTe NGs have yielded (the yield stress being fairly low), and the strain is plastically accommodated; Σ3 deformation twins, and dislocations are formed. The stored strain energy within a grain is however expected to be insufficient for further relaxation in nearby grains: accordingly, the strain energy depends on both the yield stress and elastic biaxial modulus. The <531 > texture is thus governed by strain energy minimization since the <531 > direction has one of the lowest biaxial elastic modulus [53]. The growth of the as-grown CdTe NGs on ZnO NWs preserves the typical growth regimes for their planar growth. However, the critical film thickness separating the growth regimes driven by surface or strain energy minimization is strongly decreased. Upon the CdCl2 heat treatment of the ZnO/CdTe core-shell NW arrays, CdTe NGs significantly grow and their crystallization is enhanced; the formation of the well-defined facets and GBs is shown in Figure  1 for high annealing temperature.

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